The Fault Diagnosis and Tolerance in Cryptography (FDTC) workshop brings together researchers and engineers from academia and industry who have an interest in the effect of faults, accidental or malicious, on digital devices that implement cryptographic algorithms.
The FDTC workshop includes topics such as: modelling the reliability of cryptographic systems and protocols; reliable cryptographic systems and algorithms; fault models for HW and SW cryptographic devices; fault injection attacks on cryptographic systems and protocols; classical and novel techniques of fault diagnosis and tolerance for cryptographic systems; and case studies.
The 2021 edition of the workshop will take place virtually on September 17, 2021.
Sylvain Guilley, CTO at Secure-IC will give a keynote entitled “Managing Natural Hazards and Adversarial Fault Injections in the Context of Connected Embedded Systems” and will moderate the last roundtable on Electromagnetic Disturbance in the Industry planned at 17:05 (CEST).
New capabilities have emerged where electromagnetic (EM) benches are used to cryptanalyze chips. The progress of this “research field” is fast, in terms of reproducibility, accuracy and number of use cases. Yet there is not enough awareness about such advances and their security threats. We discuss quantitative metrics to assess the harmfulness of EM fault injection (EMFI), so as to allow for a pre-silicon (source-code level) validation of the robustness against EMFI attacks and therefore for a reasonable security assessment.